ENPM676
VLSI Testing and Design for Testability
Prerequisite: ENEE244; or students who have taken courses with comparable content may contact the department. An overview of VLSI test process and equipment, faults, fault modeling, fault simulation, combinational logi ATPG, sequential logic ATPG, Iddq testing, function testing, memory testing, delay testing, design for testability, BIST (Built-In Self-Test) and boundary scan.
Past Semesters
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During the Spring 2020 and Spring 2021 semesters, students could choose to take some of their courses pass-fail mid-semester which skews grade data aggregated across multiple semesters.
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