ENMA683

Restriction: Permission of ENGR-Materials Science & Engineering department. Credit only granted for: ENMA698L or ENMA683. Formerly: ENMA698L. The operation of an electron microscope is covered. TEM techniques that are used to characterize the structure, defects and composition of a sample are presented and used to study a variety of materials. These techniques are: electron diffraction patterns, bright/dark field imaging, high resolution lattic imaging and energy dispersive x-ray spectroscopy. Also covers different sample preparation techniques for TEM. The goal is that the students become independent users of the TEM.